HIGHLIGHTS
- who: u0412u0435u0441u0442u043du0438u043a u0421u0438u0431u0413u0423u0422u0418. et al. from the Research scientist, Systems Chipu00bb research laboratory, Omsk State Technical University have published the article: u0412u0435u0440u0438u0444u0438u043au0430u0446u0438u044f u043cu043eu0434u0435u043bu0438 u0438u043du0442u0435u0433u0440u0430u043bu044cu043du043eu0439 u043au0430u0442u0443u0448u043au0438 u0438u043du0434u0443u043au0442u0438u0432u043du043eu0441u0442u0438 u0434u043bu044f u0421u0412u0427 LC-u0444u0438u043bu044cu0442u0440u043eu0432 u0432 Si- u0438 SiGe-u0441u0438u0441u0442u0435u043cu0430u0445 u043du0430 u043au0440u0438u0441u0442u0430u043bu043bu0435, in the Journal: (JOURNAL)
- how: In this paper the conductor model that can be used to design of various layout configurations for any and technological processes is considered. The chips measuring results showed that the characteristics of the prototypes taking into account the manufacturing tolerance are in the range of model simulated values.
SUMMARY
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