HIGHLIGHTS
- who: Arc Oxidation et al. from the Scanning electron microscope (SEM) , (TESCAN, Brno, Czech Republic) was used for surface morphology and cross-sectional examinationsEDS system by (Oxford instruments, Abingdon, UK) with an, MaxN detector was applied for elemental analysis detection. The phase analysis of the coating was detected using the X'Pert Pro diffractometer (PANalytical B.V [, ]. Almelo, the Netherlands) with Cuα radiation (λ=1.542Å) at the grazing incidence mode (grazing angle of, ◦ ) with a, θ range from , to, ◦ (step size of, .03◦ ) at , kV and , mA. Coating elemental analysis was also examined by pArticle induced, ray emission . . .
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