HIGHLIGHTS
- who: Milad Salem et al. from the Department of Electrical and Computer Engineering, University of Central Florida, Orlando, FL, USA have published the research work: An Experimental Evaluation of Fault Diagnosis from Imbalanced and Incomplete Data for Smart Semiconductor Manufacturing, in the Journal: (JOURNAL)
- what: In this work the challenges of this dataset are met and many different approaches for classification are evaluated to perform fault diagnosis. This model would not be able to perform is presented to it, rendering its results unreliable. the same when new data is presented to it, rendering its results . . .
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