HIGHLIGHTS
- who: Manuel J. Moreno-Lizaranzu 1 and Federico Cuesta 2 from the Escuela Técnica Superior de Ingenierı́a, University of Seville, Camino de los Descubrimientos s/n, Seville, Spain have published the Article: Improving Electronic Sensor Reliability by Robust Outlier Screening, in the Journal: Sensors 2013, 13, 13521-13542 of 16/08/2013
- what: The work described in this paper is part of the global initiatives implemented in Freescale R to ensure that the number of defective devices shipped to customers is as low as possible. The research presented in this paper focuses on . . .
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