A deep learning approach to real-time markov modeling of ion channel gating

HIGHLIGHTS

• What: The authors provide data showing that the artificial intelligence (AI) approach can compete with the previous 2D-Fit. Simulation of time series with the patch-clamp setup One goal of this study was to evaluate the robustness of the NNs when dealing with experimental patch-clamp data. Higher resistances (Patch-configuration) could not be used for this purpose since significant Article capacitive artifacts would be introduced upon each voltage change in the command protocol. In this study using the simulation routine of the 2D-Fit sets of time series covering the desired parameter space were simulated . . .
  

   

  

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