HIGHLIGHTS
- What: The aim of this paper is not to address the newly identified knowledge gaps. Combined with the clear nomenclature from this contribution a more valuable evaluation of EL images can be made.
- Who: Bengt Jaeckel and collaborators from the Fraunhofer Center for Silicon Photovoltaics CSP, Otto-Eissfeldt-Str. , , Halle (Saale) , Germany have published the Original Article: Nomenclature and description of Electro-Luminescence (EL) observations: cell cracks and other observations, in the Journal: EPJ Photovoltaics of 23/Dec/2024
- How: The sensitivity of a PV module design to cracking is tested in a . . .
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