Characterization of parasitic impedance in pcb using a flexible test probe based on a curve-fitting method

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  • who: Based on a Curve-Fitting et al. from the Department of Electrical Engineering, University of Zaragoza, Zaragoza, Spain have published the Article: Characterization of Parasitic Impedance in PCB Using a Flexible Test Probe Based on a Curve-Fitting Method, in the Journal: (JOURNAL)
  • what: The aim of this paper is to present a method for frequency characterization up to 350 MHz of parasitic impedance in 40696 PCB with long traces, such as laminated busbars, based on a new test fixture (flexible test probe) with measuring terminals spaced up to 20 centimeters apart. The aim . . .

     

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