On the effect of thin film growth mechanisms on the specular reflectance of aluminium thin films deposited via filtered cathodic vacuum arc

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  • who: Gonzalo Rincu00f3n-Llorente et al. from the Department of Materials Science, Metallurgical Engineering and Inorganic Chemistry, IMEYMAT, University of Cadiz, Puerto Real, Spain have published the Article: On the Effect of Thin Film Growth Mechanisms on the Specular Reflectance of Aluminium Thin Films Deposited via Filtered Cathodic Vacuum Arc, in the Journal: (JOURNAL)
  • what: In this work the influence of deposition parameters particularly working pressure and deposition time on the specular and diffuse reflectance of aluminium thin films was studied. Theofhigh of the films achieved because of the high energy at which pArticles reach . . .

     

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