Layered cmos spads for low noise detection of charged particles

HIGHLIGHTS

  • who: Lodovico Ratti et al. from the INFN Padova, Padova, Italy, Dipartimento di Ingegneria Industriale, Universitu00e0 di Trento, Trento, Italy, INFN TIFPA, Trento, Italy University of Surrey, United Kingdom have published the paper: Layered CMOS SPADs for Low Noise Detection of Charged Particles, in the Journal: (JOURNAL)
  • what: The aim of active quenching methods is that of mitigating afterpulsing phenomena in avalanche diodes by controlling the hold-off time of the sensor. To conclude, this work has reported on the characterization of SPADs fabricated in a commercial 150 nm CMOS technology.
  • how: This . . .

     

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