Diffraction gratings metrology and ray-tracing results for an xuv raman spectrometer at flash

HIGHLIGHTS

• who: Albert-Einstein-Strasse et al. from the 5, Germany, cUniversity of Hamburg, Notkestrasse, Hamburg , have published the article: Diffraction gratings metrology and ray-tracing results for an XUV Raman spectrometer at FLASH, in the Journal: (JOURNAL)
• what: The effect of the measured micro-roughness was also estiOur optics metrology and ray tracing have clearly demonmated.
• future: The measured efficiency energy dependence does not match very well with the efficiency calculations based on grating parameters obtained from the ex situ metrologies carried out after the manufacturing and from this work (see Fig 6 . . .
  

   

  

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