HIGHLIGHTS
- who: Mwema Fredrick and Jen Tien-Chien from the University Kingsway Campus, Johannesburg, South Africa have published the paper: Statistical and Fractal Description of Defects on Topography Surfaces, in the Journal: (JOURNAL)
- what: In this article, artificially created topography images of scan size of 1 u03bcm u00d7 1 u03bcm and with maximum height of features of 500 nm have been analysed.
- future: The future prospect of the area is to carry out an analysis with more defective images and compare with images of actual surfaces.
SUMMARY
Surface topography obtained . . .
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