Unsupervised outlier detection in iot using deep vae

HIGHLIGHTS

  • who: Walaa Gouda and colleagues from the Department of Computer Engineering and Network, College of Computer and Information Sciences, Jouf University, Sakaka, Al Jouf, Saudi Arabia have published the research: Unsupervised Outlier Detection in IOT Using Deep VAE, in the Journal: Sensors 2022, 6617 of /2022/
  • what: The authors propose an unsupervised technique based on a deep Variational Auto-Encoder (VAE) to detect outliers in IoT data by leveraging the characteristic of the reconstruction ability and the low-dimensional representation of the input data`s latent variables of the VAE. The unsupervised abnormality detection challenges . . .

     

    Logo ScioWire Beta black

    If you want to have access to all the content you need to log in!

    Thanks :)

    If you don't have an account, you can create one here.

     

Scroll to Top

Add A Knowledge Base Question !

+ = Verify Human or Spambot ?