HIGHLIGHTS
- who: Ryo Izumi and collaborators from the Department of Applied Physics, Graduate School of Engineering, Osaka University, Yamadaoka, Suita, Osaka, Japan have published the research: High-low Kelvin probe force spectroscopy for measuring the interface state density, in the Journal: (JOURNAL)
- what: The authors propose high-low (high-low KPFS) an electrostatic method using high- and low-frequency AC bias voltages to measure the interface state density inside semiconductors. The authors show that the electrostatic force between the tip and the semiconductor sample strongly depends on the capacitance of the charge depletion region on the . . .
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