HIGHLIGHTS
- who: Jing-jin Zhang and colleagues from the Shenzhen, China College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen, China have published the article: Secondary Amplifier Sampling Component Design of an X-ray Framing Detector Based on a Streak Tube, in the Journal: Sensors 2023, 23, 2700. of /2023/
- what: In this work an electron beam separation device was designed and developed for the first time. Since the cohesion of the electron beam in the focus area is related to its off-axis height (the direction of its movement), the secondary amplification device cannot be . . .
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