HIGHLIGHTS
- who: Zita Oravecz from the University of California, San Diego, United States have published the Article: Accounting for retest effects in cognitive testing with the Bayesian double exponential model via intensive measurement burst designs, in the Journal: (JOURNAL)
- what: The authors propose a psychometric cognitive process model, the Bayesian double exponential model (BDEM) to disentangle retest learning effects from longitudinal changes in asymptotic performance. While the primary aim of BDEM is to disentangle learning features from peak performance (with the goal of modeling asymptotic change over time), each model parameter may also be of interest . . .
If you want to have access to all the content you need to log in!
Thanks :)
If you don't have an account, you can create one here.