HIGHLIGHTS
- who: Lidia Martu00ednez Herraiz et al. from the Laboratorio Crecimiento Cristales, Departamento Fu00edsica Materiales, Universidad Autu00f3noma have published the Article: Ellipsometry Characterisation for the Cd1-xZnxTe1-ySey Semiconductor Used in X-ray and Gamma Radiation Detectors, in the Journal: Crystals 2023, 693 of /2023/
- what: Two samples with extreme values of selenium content (y=0.02 (Se2) and 0.07 (Se7)), generally used in Cd1-x Znx Te1-y Sey detectors, verified that the ellipsometry method that the authors propose in this work is valid for any selenium composition used in CZTS detectors. This work . . .
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