HIGHLIGHTS
- who: Films et al. from the Department of Frontier Materials, Nagoya Institute of Technology, Nagoya, Japan, Graduate School of Engineering, Nagoya University, Nagoya, Japan, UVSOR Facility, Institute for Molecular Science, Okazaki, Japan, School of Physical Sciences, The have published the article: Observation of Thickness-Dependent Exchange Interaction in EuO Ultrathin Films, in the Journal: (JOURNAL)
- what: Before reporting the detailed results of 3D-ARPES measurements, the authors show the expected electronic structure of EuO ultrathin film calculated using the LSDA + U method.
SUMMARY
EuO has shown the highest TC (about 70 . . .
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