HIGHLIGHTS
- who: Alina Muravitskaya and colleagues from the Laboratory Light, Nanomaterials and Nanotechnologies, CNRS ERL, University of Technology of Troyes, rue Marie Curie, Troyes, France have published the research work: Enhanced Resonant Raman Scattering of GaN Functional Layers Using Al Thin Films - A Versatile Tool for Multilayer Structure Analysis, in the Journal: (JOURNAL)
- what: The authors demonstrate experimentally that nanostructured aluminum films deposed on GaN epitaxial layers decrease the influence of the photoluminescence on the resonant Raman spectra and increase its overall spatial resolution under UV illumination. The authors show that Al thin layers deposited on . . .
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