HIGHLIGHTS
- who: Kouichi Hagino and collaborators from the (UNIVERSITY) have published the Article: Radiation-Induced Degradation Mechanism of X-ray SOI Pixel Sensors with Pinned Depleted Diode Structure, in the Journal: (JOURNAL)
- what: The authors investigate the radiation-induced degradation mechanism of XRPIX utilizing 3-dimensional device simulations.
SUMMARY
It has been developed for a future wide-band Xray astronomical satellite FORCE aiming for a launch in the early 2030s -[4]. Such a low-noise performance enabled the detection of low-energy X-rays below 1 keV. Ionizing_radiations increase the interface state . . .
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