Reliability of x7r multilayer ceramic capacitors during high accelerated life testing (halt)

HIGHLIGHTS

  • who: Ana María Hernández-López and colleagues from the Universidad Autónoma Nuevo León, CICFIM, NL, MX, Mexico have published the research: Reliability of X7R Multilayer Ceramic Capacitors During High Accelerated Life Testing (HALT), in the Journal: (JOURNAL)
  • what: The authors analyzed the lifetime of three similar X7R type MLCCs based on BaTiO3 by conducting High Accelerated Life Tests (HALT) at temperatures up to 200 ◦ C at 400 V and 600 V. The authors determined the time to failure of BaTiO3 -based X7R (classification according to the Electronics Components, Assemblies and . . .

     

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