HIGHLIGHTS
- who: - Charge pumping and collaborators from the Department of Electrical and Computer Engineering, Sungkyunkwan have published the paper: Charge Pumping Technique to Measure Polarization Switching Charges of FeFETs, in the Journal: (JOURNAL)
- what: -This study proposes a new method to measure the of field effect transistors (FeFETs) using a pulse generator and source measurement unit (SMU) and exploiting the (CP) principle which is widely followed to measure the interface trap density (Dit) of MOSFETs. This study proposes a new measurement method by combining the existing P-V and CP measurement methods. The authors demonstrate that . . .
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