HIGHLIGHTS
- who: Paul Narchi from the (UNIVERSITY) have published the Article: Cross-Sectional Investigations on Epitaxial Silicon Solar Cells by Kelvin and Conducting Probe Atomic Force Microscopy: Effect of Illumination, in the Journal: (JOURNAL)
- what: The authors report on and measurements with nanometer scale resolution performed on the cross section of an epitaxial crystalline silicon solar cell using respectively Kelvin microscopy and microscopy. This study shows that scanning probe microscopy techniques are useful tools to analyze the homogeneity of PN junctions and the effect of illumination at the nanoscale. Ongoing work is carried out to investigate . . .
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