HIGHLIGHTS
- who: - Benchmark tests and colleagues from the (UNIVERSITY) have published the paper: FPGA Qualification and Failure Rate Estimation Methodology for LHC Environments Using Benchmarks Test Circuits, in the Journal: (JOURNAL)
- what: In this article, a testing methodology to overcome the aforementioned problems is presented. The work presented an approach for FPGA testing, based on benchmark circuits.
- how: To address the devices' sensitivity to HEH and ThN individually the FPGAs are tested in two different facilities.
- future: Future works will focus on a deeper study of the SEFIs occurred in the PolarFire . . .
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