HIGHLIGHTS
- who: An integrated and colleagues from the CentreUniversity of Exeter , QF, United Kingdom have published the article: An integrated and multi-purpose microscope for the characterization of atomically thin optoelectronic devices, in the Journal: (JOURNAL) of 21/09/2016
- what: The authors characterize this apparatus by performing multiple measurements on transition metal dichalcogenides (TMDs) and Si. The authors present an experimental apparatus developed to characterize optoelectronic devices based on graphene and other 2D materials. The authors characterize the instrument with a series of standard measurements: SPCM on graphene-based photodetectors as well as absorption, Raman . . .
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