Comprehensive polarimetric analysis of spectralon white reflectance standard in a wide visible range

HIGHLIGHTS

• who: J. M. Sanz and colleagues from the Departamento de Física Aplicada, Universidad de Cantabria, AvdaLos Castros s/n, Santander, Spain have published the article: Comprehensive polarimetric analysis of Spectralon white reflectance standard in a wide visible range, in the Journal: (JOURNAL) of 12/04/2013
• what: The aim of this research is to make this comprehensive study of the scattering behavior of Spectralon by means of a full polarimetric analysis within the visible spectrum (at 488.0, 520.8, 530.9, 568.2, and 632.8 nm) and in a broad range of . . .
  

   

  

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