A cmos image readout circuit with on-chip defective pixel detection and correction

HIGHLIGHTS

• who: Bu00e1rbaro M. Lu00f3pez-Portilla et al. from the Electrical Engineering Department, University of, Edmundo Larenas, Albuquerque, NM, USA have published the research work: A CMOS Image Readout Circuit with On-Chip Defective Pixel Detection and Correction, in the Journal: Sensors 2023, 23, 934. of /2023/
• what: To validate the approach the authors designed 128 u00d7 imager in 0.35 u00b5m process which integrates the detection /correction circuits and processes images at 694 frames per second according to post-layout simulations. The authors propose a novel CMOS SIS architecture for on-chip defective pixel detection . . .
  

   

  

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