HIGHLIGHTS
- who: CHRISTIAN O. OKREGHE and colleagues from the Department of Electronic and Electrical Engineering, University College London, Malet Place, London WC E JE, United Kingdom have published the paper: A Deep Neural Network-Based Spike Sorting with Improved Channel Selection and Artefact Removal, in the Journal: (JOURNAL)
- what: Though the purpose of this study was to enrich the potential of classic spike detection with a simple implementation of a deep learning-based spike detection algorithm, it unequivocally demonstrates that it is robust to the defined class of artefacts. For the model learning, mini-batch gradient . . .
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