A nanomechanical testing framework yielding front & rear-sided, high-resolution, microstructure-correlated sem-dic strain fields

HIGHLIGHTS

• who: T. Vermeij from the (UNIVERSITY) have published the article: A Nanomechanical Testing Framework Yielding Front & Rear-sided, High-resolution, Microstructure-correlated SEM-DIC Strain Fields, in the Journal: (JOURNAL)
• what: The authors propose a nanomechanical testing framework that has been carefully designed to integrate several state-ofthe-art testing and characterization methods. enabled by a recently developed InSn nano-DIC speckle pattern (iii) optimized DIC strain mapping aided by application of SEM scanning artefact correction and DIC deconvolution for improved spatial resolution (iv) a novel microstructure-to-strain of microstructure strain and SEM-BSE . . .
  

   

  

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