A review on igbt module failure modes and lifetime testing

HIGHLIGHTS

• who: AHMED ABUELNAGA and collaborators from the of Electrical Computer Engineering, McMaster University, Hamilton, ON L S , Canada have published the research work: A Review on IGBT Module Failure Modes and Lifetime Testing, in the Journal: (JOURNAL)
• what: The paper provides a comprehensive review on IGBT modules dominant failure modes long-term reliability. The focus of this article is on DC power cycling test. In this work, a new model was proposed to cope with the advances in module technologies from the time of LESIT project.
• how: The module is then assembled into . . .
  

   

  

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