HIGHLIGHTS
- who: A synchrotron X-ray diffraction and collaborators from the School of Materials, University of Manchester, Manchester , PL, UK, bDiamond Light Source, Chilton, Didcot have published the Article: A synchrotron X-ray diffraction deconvolution method for the measurement of residual stress in thermal barrier coatings as a function of depth, in the Journal: (JOURNAL)
- what: And in the experiment , no variation in ` angle was carried out.
- how: This paper introduces a method to extract the residual stress as a function of depth in thick coatings (TBCs) using highenergy monochromatic synchrotron X-rays and . . .
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