Acceptor defects in polycrystalline ge layers evaluated using linear regression analysis

HIGHLIGHTS

• who: Toshifumi Imajo from the InstitutUniversity of have published the research work: Acceptor defects in polycrystalline Ge layers evaluated using linear regression analysis, in the Journal: Scientific Reports Scientific Reports
• what: The authors propose a linear regression analysis method, which clarifies that the poly-Ge layers contain two types of acceptor levels, as illustrated in Fig 4c.
• how: The authors proposed a linear regression analysis method to derive the acceptor levels and densities from the temperature dependence of p which revealed the existence of two types of acceptor level.

SUMMARY

 



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