HIGHLIGHTS
- who: (TFTs). and colleagues from the (UNIVERSITY) have published the article: An Approach to Simultaneously Test Multiple Devices for High-Throughput Production of Thin-Film Electronics, in the Journal: (JOURNAL)
- what: The authors report a Simultaneous Multiple Device Testing (SMuDT) approach which is up to 10 times faster and cost effective than conventional testing methods.
- how: Primarily the frequency data was analysed in Fig 6(a).
SUMMARY
P material system the TFTs need to be manufactured using high-throughput, large-area, and low cost processing techniques such as roll . . .
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