An early detection circuit for endurance enhancement of backfilled contact resistive random access memory array

HIGHLIGHTS

  • who: Yun-Feng Kao from the (UNIVERSITY) have published the Article: An Early Detection Circuit for Endurance Enhancement of Backfilled Contact Resistive Random Access Memory Array, in the Journal: (JOURNAL)
  • what: In this study, correlations of LFNs, topographies of CFs and reset failure during cycling are established.
  • how: Two detection circuits BG method and ST method are proposed and investigated to screen out the vulnerable cells for early recovery interventions.

SUMMARY

    Aside from pulse conditioning, strong set/reset electrical recovery treatments on devices after endurance failure are found that . . .

     

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