HIGHLIGHTS
- who: Arun Pandian J. and colleagues from the Department of Computer Science and Engineering, DrSagunthala and D Institute of Science and Technology, Chennai, India School of Computing and Information Technology, Reva University, Bengaluru, India have published the research: An Improved Deep Residual Convolutional Neural Network for Plant Leaf Disease Detection, in the Journal: Computational Intelligence and Neuroscience of 14/09/2022
- what: The authors proposed a novel deep residual convolutional neural network with 197 layers (ResNet197) for the detection of various plant leaf diseases.
- how: The authors provided a brief study about plant . . .

If you want to have access to all the content you need to log in!
Thanks :)
If you don't have an account, you can create one here.