HIGHLIGHTS
- who: Wanneng Yang from the National Key Laboratory of Crop Genetic Improvement, National Center of Gene Research (Wuhan), College of Engineering, Agricultural University, Wuhan, China have published the paper: An Intelligent Rice Yield Trait Evaluation System Based on Threshed Panicle Compensation, in the Journal: (JOURNAL)
- what: The aim of this study is to build an automatic and intelligent system for rice yield trait evaluation. Since it is difficult to thresh all the spikelet's in the panicle, most of the studies focus on grain traits measurement. This study demonstrated a novel automatic system for rice . . .
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