HIGHLIGHTS
- who: Rachid Bouregba et al. from the Universitu00e9 de Caen Basse-Normandie, UMR , CRISMAT, Caen, France have published the Article: Artificial duplication of polarization fatigue in Pb(Zr0.54Ti0.46)O3 thin film capacitors, in the Journal: (JOURNAL)
- what: The authors focus on hysteresis measurements that imply large signal analysis.
- how: The final result is shown in Fig 8.b).
SUMMARY
Circuit is calibrated by assuming that aging is caused by deterioration of the dielectric and electrostatic properties of the interfaces. But this original approach also considers the screening . . .
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