HIGHLIGHTS
- who: (Received and colleagues from the Department of Physics, SUPA, University of Strathclyde, Glasgow , NG, UK have published the research work: Assessing the Impact of Secondary Fluorescence on X-Ray Microanalysis Results from Semiconductor Thin Films, in the Journal: (JOURNAL)
- what: The aim of this study is to investigate the influence of secondary X-ray fluorescence on the calculated composition of semiconductor materials, quantifying the contributions of CSF and BSF. In is initially reduced when BSF X-rays are included Next, the authors investigate the impact of secondary fluorescence on WDX data measured from a . . .
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