Built-in functional testing of analog in-memory accelerators for deep neural networks

HIGHLIGHTS

• who: Abhishek Mishra and collaborators from the Electrical and Computer Engineering Department, Drexel University, Chestnut Street, Philadelphia, PA, USA have published the paper: Built-In Functional Testing of Analog In-Memory Accelerators for Deep Neural Networks, in the Journal: Electronics 2022, 11, 2592. of /2022/
• what: Assuming a fault model the authors develop methods to generate pseudorandom and structured test patterns to detect hardware faults. The authors develop a methodology for the online built-in functional testing of NVM-based inmemory accelerators for DNNs used in image classification tasks. The authors develop test-pattern generation . . .
  

   

  

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