HIGHLIGHTS
- who: (Received et al. from the University of, EMAT, Groenenborgerlaan, and NANOlab Center of Excellence, University of, Groenenborgerlaan , have published the paper: Can a Programmable Phase Plate Serve as an Aberration Corrector in the Transmission Electron Microscope (TEM)?, in the Journal: (JOURNAL)
- what: The authors explore different designs for such phase plates with the specific goal of correcting spherical aberration in the transmission electron microscope (TEM). As simple as the idea may sound, the devil is in the details, and the authors attempt in this paper to give an overview of the design parameters that . . .
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