Characterization and analysis of on-chip microwave passive components at cryogenic temperatures

HIGHLIGHTS

• who: BISHNU PATRA and collaborators from the Department of Quantum and Computer Engineering, Delft University of Technology, CD Delft, The Netherlands have published the Article: Characterization and Analysis of On-Chip Microwave Passive Components at Cryogenic Temperatures, in the Journal: (JOURNAL)
• what: Passive components at cryogenic temperatures show in general higher quality factor (~2u00d7) due to higher metal conductivity and lower loss in the substrate.
• how: This paper presents the characterization and modeling of microwave passive components in TSMC 40-nm bulk CMOS including metal-oxide-metal (MoM) capacitors transformers and resonators at . . .
  

   

  

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