Characterization of flexible amorphous silicon thin-film transistor-based detectors with positive-intrinsic-negative diode in radiography

HIGHLIGHTS

  • who: Bongju Han et al. from the Department of Radiological Science, College of Health Science, Gachon University have published the Article: Characterization of Flexible Amorphous Silicon Thin-Film Transistor-Based Detectors with Positive-Intrinsic-Negative Diode in Radiography, in the Journal: Diagnostics 2022, 2103 of 29/08/2022
  • what: This approach has a superior dynamic range over the film/screen method and can reduce the patient dose . This approach has the merit of extremely high intrinsic spatial resolution and mainly uses mammography . The authors examined a novel indirect conversion detector with a flexible a-Si . . .

     

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