HIGHLIGHTS
- who: Shuo Liu and colleagues from the Department of Physics and Astronomy, Purdue University, West Lafayette, IN, USA have published the article: Connecting Complex Electronic Pattern Formation to Critical Exponents, in the Journal: (JOURNAL)
- what: The authors show how data from surface probes can be used to distinguish whether electronic patterns observed at the surface of a material are confined to the surface or whether the patterns originate in the bulk. The authors show that when considered on a 2D slice of a 3D system the pair connectivity function familiar from percolation theory displays more . . .
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