Contactless defects detection using modulated photoluminescence technique: model for a single shockley-read-hall trap in a semiconductor thin layer

HIGHLIGHTS

• What: The authors focus on the use of a contactless frequency domain technique: modulated photoluminescence (MPL), and show its potential to detect defects. In line with this preceding work, the goals of this article are (i) to verify the analytical calculation by parametric numerical studies, (ii) to take into account the effect of the defect density on the V-Shape appearance, (iii) to extend the study to undoped materials. It is then possible to choose three of them, and the resolution the authors develop further will use equations and_( 3 ) and_( 4 ). At this point of this . . .
  

   

  

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