Contactless mapping of lifetime and diffusion length scan map of minority carriers in silicon wafers

HIGHLIGHTS

• who: O. Palais and colleagues from the Laboratoire Photoélectricité LPDSOb, Université Marseilles, Marseille , France have published the research work: Contactless mapping of lifetime and diffusion length scan map of minority carriers in silicon wafers, in the Journal: PHYSICAL JOURNAL of 22/09/2021
• what: We have shown that it is possible to measure the value of the minority carrier lifetime in silicon crystals, value close to the bulk value, thanks to the passivation of the wafer surfaces by immersion in an aqueous solution of polyvidone.

SUMMARY

The lifetime (τ ) of minority . . .

 



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