HIGHLIGHTS
- who: (Received et al. from the Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USACenter for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA have published the research: Contrast Mechanisms in Secondary Electron e-Beam-Induced Current (SEEBIC) Imaging, in the Journal: (JOURNAL)
- what: The authors provide a brief review of recent work in this area examine the various contrast generation mechanisms associated with SEEBIC and illustrate its use for the characterization of graphene nanoribbon devices. By adopting these different naming conventions, the authors aim to clearly delineate . . .
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