Convolutional network research for defect identification of productor appearance surface

HIGHLIGHTS

• who: Xu Xie and Xizhong Shen from the School of Electrical and Electronic Engineering, Shanghai Institute of Technology, Shanghai, China have published the Article: Convolutional Network Research for Defect Identification of Productor Appearance Surface, in the Journal: Electronics 2022, 11, 4218 Electronics 2022, 11, x FOR PEER REVIEW of /2022/
• what: In this paper a lightweight KD-EG-RepVGG network based on structural reparameterization is designed for the identification of defects on strip steel as an example. The main function of the D-RepVGG block module is to extract features and adjust the space size . . .
  

   

  

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