HIGHLIGHTS
- who: -Ferroelectric FET and collaborators from the (UNIVERSITY) have published the research work: Cross-Layer Reliability Modeling of Dual-Port FeFET: Device- Algorithm Interaction, in the Journal: (JOURNAL)
- what: In this work the impact of temperature variation is analyzed for dual-port FeFETs for the first time in a cross-layer manner starting from the device level to the circuit/system levels and compared to conventional FeFET. The authors focus in the analysis on Hyperdimensional Computing (HDC) which is an emerging type of machine learning algorithm that is being executed on top of FeFET-based . . .
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