HIGHLIGHTS
- who: Hao Shen and collaborators from the Department of Applied Physics, School of, Chang'an University, Xi'an, China have published the article: Defect- and Interface-Induced Dielectric Loss in ZnFe2O4/ZnO/C Electromagnetic Wave Absorber, in the Journal: Nanomaterials 2022, 12, 2871. of 20/08/2022
- what: This study provides a view into the relationship between defects interfaces EM parameters and EMW absorption ability and also suggests an effective way to promote EMW dissipation ability of the absorbers by controlling defects and interfaces. As shown in Figure 8b,c, S3 has much larger ε00 . . .
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