Denoising fault-aware wavelet network: a signal processing informed neural network for fault diagnosis

HIGHLIGHTS

• who: Zuogang Shang from the This dataset is provided by the Institute of Design Science and Basic Component at Xi`an Jiaotong University and the Changxing Sumyoung Technology Co[35]. The accelerated degradation bearing testbed and corresponding accelerometer layout are shown in Figure, . Data are acquired at a sampling frequency of, ., kHz. The detailed data information is described in Table, . Similar to Ref. [36], horizontal data at the end of run-to-failure experiments are used. The data from five bearings are divided into five categories. Each signal is segmented into samples of , points without overlap. The . . .
  

   

  

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