Depth profiling of residual activity of fragments as a range verification technique for primary ion beam

HIGHLIGHTS

• who: . et al. from the GSI Helmholtzzentrum für Schwerionenforschung, Planckstrasse, Darmstadt, Germany have published the research: Depth profiling of residual activity of fragments as a range verification technique for primary ion beam, in the Journal: Phys. Rev. ST Accel. Beams 15, 071001 (2012) of /0710/
• what: The study was performed by comparing results obtained from the activation (depth-profiling) experiments with computer simulations as well as with complementary experiments based on different techniques . This experiment provides the range of 13.1 and 14.4 mm for copper and stainless steel, respectively irradiated with U . . .
  

   

  

  If you want to have access to all the content you need to log in!

  Thanks :)

  Username or Email

  Password

  Remember me

  Lost your password?

  If you don't have an account, you can create one here.